Corrugation Effects in Oxygen Surface Trapping at Hyperthermal Energies
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We have measured trapping probabilities for 5-600 eV O+ ions incident on Cu(001) at 45 degrees and along the sample normal. These results have been reproduced using classical trajectory simulations. In the simulations, the surface trapping probability P-s is distinguished from the total trapping probability P-T At 45 degrees, the energy dependence of P-s differs significantly from that of Na+ incident on Cu(001). Trajectory analysis shows that differences between the trapping trends can be attributed to differences in the apparent surface corrugation for these two systems.